Authors

Haoguo Zhang, Shun Ishioka, Noriyuki Isobe, Katsunori Kimoto, Satoshi Okada, Yohsuke Goi, Shuji Fujisawa, Tsuguyuki Saito* (*corresponding author)

Paper Information

Journal
: Chemical Engineering Journal
DOI
: 10.1016/j.cej.2025.166482